发明名称 |
Method for locating surface defects |
摘要 |
The method involves determining two mean values for two light intensities for a pixel sensor (21) and a time point. The criteria check the value for a time lag, where an edge of an outbreak or an error of the surface is detected, when the number of criteria is satisfied. Independent claims are also included for the following: (1) an apparatus for finding edges of outbreaks on the surface of elongated objects; (2) a method for improving the classification of errors; and (3) a data carrier with program. |
申请公布号 |
EP2463175(A2) |
申请公布日期 |
2012.06.13 |
申请号 |
EP20110450150 |
申请日期 |
2011.12.06 |
申请人 |
AIT AUSTRIAN INSTITUTE OF TECHNOLOGY GMBH |
发明人 |
HUBER-MOERK, REINHOLD;MAYER, KONRAD |
分类号 |
B61L23/04;G01B11/24;G01N21/89;G01N21/95 |
主分类号 |
B61L23/04 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|