发明名称 Trench gate MOSFET and method of manufacturing the same
摘要 <p>A trench metal-oxide-semiconductor field effect transistor (MOSFET) (100), includes a drain region (150,155), gate regions (125) disposed above the drain region, gate insulator regions (130) each disposed about a periphery of a respective gate region, a plurality of source regions (120) disposed in recessed mesas between gate insulator regions, a plurality of body regions (145) disposed in said recessed mesas between gate insulator regions and between source regions and the drain region. The MOSFET also includes body contact regions (147) each disposed in a respective body region, source/body contact spacers (140) disposed between gate insulator regions above the recessed mesas, a source/body contact (110) disposed above the source/body contact spacers, and source/body contact plugs (115) disposed between the source/body contact spacers and coupling the source/body contact to the body contact regions and the source regions. </p>
申请公布号 EP1978562(A3) 申请公布日期 2012.06.13
申请号 EP20080006487 申请日期 2008.03.31
申请人 VISHAY-SILICONIX 发明人 LI, JIAN;CHEN, KUO-IN;TERRIL, KYLE
分类号 H01L29/78;H01L21/336;H01L29/10;H01L29/417;H01L29/423;H01L29/45;H01L29/49 主分类号 H01L29/78
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