| 摘要 |
Described herein is a method of increasing the dynamic range of pixels in an imaging sensor. Two image captures are performed, one at a first short integration time ( T 1 ) and one at a second optimum integration time ( T 1 , T 2 , T max ). An electrical value (V A (1), V B (1), V c (1)) obtained from a pixel or group of pixels at the first short integration time ( T 1 ) is used to predict the second integration time ( T 1 , T 2 , T max ) using a comparison with a set of reference values (V t (i)). The reference values (V t (i)) are related to a saturation electrical value ( V sat ) for each pixel or group of pixels to predict the second integration time ( T 1 , T 2 , T max ). The first short integration time ( T 1 ) is determined as a fractional multiple of the saturation electrical value ( V sat ), and the second integration times ( T 1 , T 2 , T max ) are such that there is no saturation of the pixel or group of pixels. Adjustments can be made to the reference values to allow for offset immunity and variability in light levels during the second integration time. |
