ADC for cancelling column fixed pattern noise and CMOS image sensor using it

摘要

PURPOSE: ADC for cancelling column fixed pattern noise and a CMOS(Complementary Metal-Oxide Semiconductor) image sensor using the same are provided to form improved images by eliminating C-FPN(Column Fixed Pattern Noise) properties from a CIS(CMOS Image sensor). CONSTITUTION: A comparison unit(600) outputs comparison results in a comparison unit output signal by comparing a lamp input having a constant slope according to specific input voltages and time. A sync shift block part(610) controls a sync signal. A memory block part(620) stores a digital counter output value of an n-bit counter(630) in n bit memory(640) according to a sync signal in the sync shift block part. The n-bit counter generates the digital counter output value of n bit. The n bit memory stores the digital counter output value generated from the n-bit counter. C-FPN(Column Fixed Pattern Noise) removing memory(650) respectively stores outputs from each column ADCs.