发明名称 ACTIVE RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, AND RESIST FILM AND PATTERN FORMING METHOD USING THE SAME
摘要 PURPOSE: An active ray-sensitive or radiation-sensitive resin composition, a resist film using the same, and a method for forming the patterns are provided to prevent the generation of development defects in case of electron-beam exposure. CONSTITUTION: An active ray-sensitive or radiation-sensitive resin composition includes a resin. The resin includes a repeating unit represented by chemical formula I or II, a repeating unit generating alkali soluble groups, and a repeating unit represented by chemical formula X. The repeating unit represented by chemical formula I or II generates acid anions at the side chain of the resin according to the decomposition of acid ray or radiation ray irradiation. The repeating unit generating the alkali soluble groups is based on the action of acid.
申请公布号 KR20120061057(A) 申请公布日期 2012.06.12
申请号 KR20110075509 申请日期 2011.07.29
申请人 FUJIFILM CORPORATION 发明人 TAKAHASHI HIDENORI;HIRANO SHUJI;TSUBAKI HIDEAKI
分类号 G03F7/004;G03F7/039;H01L21/027 主分类号 G03F7/004
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