发明名称 |
Microprobes |
摘要 |
Microprobes in various designs are provided including microprobes having a bulk base and a thin probe extending from the bulk base and a Wheatstone-bridge sensor circuit for measuring strain in the thin probe, and microprobes with two thin probes extending from the bulk base with their respective integrated Wheatstone-bridges to eliminate common mode forces experienced by the two thin probes. |
申请公布号 |
US8197418(B2) |
申请公布日期 |
2012.06.12 |
申请号 |
US20080663552 |
申请日期 |
2008.06.09 |
申请人 |
LAL AMIT;PADUCH DARIUS;ABHISHEK RAMKUMAR;SCHLEGEL PETER;CORNELL UNIVERSITY |
发明人 |
LAL AMIT;PADUCH DARIUS;ABHISHEK RAMKUMAR;SCHLEGEL PETER |
分类号 |
A61B5/00;A61B5/103;A61B5/117 |
主分类号 |
A61B5/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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