发明名称 NONVOLATILE MEMORY DEVICE AND OPERATING METHOD THEREOF
摘要 <p>PURPOSE: A nonvolatile memory device and an operating method thereof are provided to improve reliability by reducing a leakage current of a cell string in which a program is prohibited. CONSTITUTION: A plurality of doped regions(311-313) are formed on a substrate(111). A plurality of pillars(PL11,PL21) comprise a channel layer(114) and inner materials(115). Conductive materials(CM1-CM8) and insulation materials(112,112a) are cut on the doped region by a word line cut. A plurality of drains(320) are formed on the pillars. The plurality of drains are connected to a bit line(BL1).</p>
申请公布号 KR20120060661(A) 申请公布日期 2012.06.12
申请号 KR20100122275 申请日期 2010.12.02
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHOE, BYEONG IN;SHIM, SUN IL;JANG, SUNG HWAN;LEE, WOON KYUNG;JANG, JAE HOON
分类号 H01L27/115;G11C16/34 主分类号 H01L27/115
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