发明名称 IC with test and shadow access ports and output circuit
摘要 The disclosure describes a novel method and apparatus for providing a shadow access port within a device. The shadow access port is accessed to perform operations in the device by reusing the TDI, TMS, TCK and TDO signals that are used to operate a test access port within the device. The presence and operation of the shadow access port is transparent to the presence and operation of the test access port. According to the disclosure, the shadow access port operates on the falling edge of the TCK signal while the test access port conventionally operates on the rising edge of the TCK signal.
申请公布号 US8201036(B2) 申请公布日期 2012.06.12
申请号 US201113183113 申请日期 2011.07.14
申请人 WHETSEL LEE D.;TEXAS INSTRUMENTS INCORPORATED 发明人 WHETSEL LEE D.
分类号 G01R31/28 主分类号 G01R31/28
代理机构 代理人
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