发明名称 Dual tone development processes
摘要 A method and system for patterning a substrate using a dual-tone development process is described. The method and system comprise using a resist material having a polymer backbone with a plurality of protecting groups attached thereto to improve process latitude and critical dimension uniformity for the dual-tone development process.
申请公布号 US8197996(B2) 申请公布日期 2012.06.12
申请号 US20090560873 申请日期 2009.09.16
申请人 FONSECA CARLOS A.;SOMERVELL MARK;SCHEER STEVEN;TOKYO ELECTRON LIMITED 发明人 FONSECA CARLOS A.;SOMERVELL MARK;SCHEER STEVEN
分类号 G03C5/00 主分类号 G03C5/00
代理机构 代理人
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