| 发明名称 |
Diamond film deposition and probes |
| 摘要 |
Diamond SPM and AFM probes which are durable, particularly for scanning hard surfaces such as diamond surfaces. Interlayers and seeding can be used to improve diamond deposition, and the diamond can be ultrananocrystalline diamond (UNCD). Tip sharpening improves resolution.
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| 申请公布号 |
US8197701(B2) |
申请公布日期 |
2012.06.12 |
| 申请号 |
US20080172109 |
申请日期 |
2008.07.11 |
| 申请人 |
CARLISLE JOHN A.;MOLDOVAN NICOLAIE;ADVANCED DIAMOND TECHNOLOGIES, INC. |
发明人 |
CARLISLE JOHN A.;MOLDOVAN NICOLAIE |
| 分类号 |
B44C1/22;C25F3/00;G01Q60/38;G01Q70/10;G01Q70/14;G01Q70/16 |
主分类号 |
B44C1/22 |
| 代理机构 |
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代理人 |
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| 主权项 |
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| 地址 |
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