| 摘要 |
PURPOSE: A connecting unit for testing a semiconductor and a connector assembly thereof are provided to detach a connector pin from a connection terminal. CONSTITUTION: A connecting unit(100) is combined to a connector for testing electric characteristics of semiconductor units. A connecting unit includes a main body(110), a support unit(120), and a plurality of connecting terminals(130). The support unit is formed to the main body. The support unit is inserted to the connector. A plurality of connector is arranged on the support unit. A concave aligned groove(150) is formed to the connecting terminal. |
