发明名称 |
3-layer Resistive RAM of having self selective characteristics |
摘要 |
<p>PURPOSE: A trilaminar resistance alteration memory having self selection characteristics is provided to efficiently prevent malfunction by blocking a leakage current through a memory cell maintaining a high resistance state. CONSTITUTION: A bottom electrode(110) is formed on a substrate(100). A resistance alteration layer(120) is formed on the bottom electrode. The resistance alteration layer comprises a first oxygen depletion oxide film, a second oxygen depletion oxide film, and a third oxygen depletion oxide film. The resistance alteration layer has state change according to formation and extinction of a conductive channel and self selection characteristics according to the state change. A top electrode(130) is formed at the upper side of the resistance alteration layer.</p> |
申请公布号 |
KR20120059195(A) |
申请公布日期 |
2012.06.08 |
申请号 |
KR20100120842 |
申请日期 |
2010.11.30 |
申请人 |
IUCF-HYU (INDUSTRY-UNIVERSITY COOPERATION FOUNDATION HANYANG UNIVERSITY) |
发明人 |
HONG, JIN PYO;BAE, YOON CHEOL;KWAK, JUNE SIK;LEE, AH RHAM |
分类号 |
H01L27/115;H01L21/8247 |
主分类号 |
H01L27/115 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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