发明名称 3-layer Resistive RAM of having self selective characteristics
摘要 <p>PURPOSE: A trilaminar resistance alteration memory having self selection characteristics is provided to efficiently prevent malfunction by blocking a leakage current through a memory cell maintaining a high resistance state. CONSTITUTION: A bottom electrode(110) is formed on a substrate(100). A resistance alteration layer(120) is formed on the bottom electrode. The resistance alteration layer comprises a first oxygen depletion oxide film, a second oxygen depletion oxide film, and a third oxygen depletion oxide film. The resistance alteration layer has state change according to formation and extinction of a conductive channel and self selection characteristics according to the state change. A top electrode(130) is formed at the upper side of the resistance alteration layer.</p>
申请公布号 KR20120059195(A) 申请公布日期 2012.06.08
申请号 KR20100120842 申请日期 2010.11.30
申请人 IUCF-HYU (INDUSTRY-UNIVERSITY COOPERATION FOUNDATION HANYANG UNIVERSITY) 发明人 HONG, JIN PYO;BAE, YOON CHEOL;KWAK, JUNE SIK;LEE, AH RHAM
分类号 H01L27/115;H01L21/8247 主分类号 H01L27/115
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