发明名称 |
SONDE POUR MICROSCOPIE A FORCE ATOMIQUE |
摘要 |
<p>A probe for atomic force microscopy (SM) comprising a micromechanical resonator (RMM) and a tip for atomic force microscopy (P1) projecting from said resonator, the probe being characterized in that: it also includes means (EL1) for selectively exciting a volume mode of oscillation of said resonator (RMM); and in that said tip for atomic force microscopy (P1, P1′) projects from said resonator substantially in correspondence with an antinode point (PV1) of said volume mode of oscillation. An atomic force microscope including such a probe (SM′). A method of atomic force microscopy including the use of such a probe.</p> |
申请公布号 |
FR2915803(B1) |
申请公布日期 |
2012.06.08 |
申请号 |
FR20070003161 |
申请日期 |
2007.05.02 |
申请人 |
CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE (C.N.R.S.) |
发明人 |
FAUCHER MARC;BUCHAILLOT LIONEL;AIME JEAN PIERRE;LEGRAND BERNARD LOUIS AMAND;COUTURIER GERARD |
分类号 |
G01Q20/04;G01Q30/12;G01Q60/32;G01Q60/38 |
主分类号 |
G01Q20/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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