TEST CIRCUIT, SERIAL I/F CIRCUIT AND SEMICONDUCTOR DEVICE

摘要

PROBLEM TO BE SOLVED: To provide a test circuit that can set a test mode and input a test signal after setting the test mode even if a terminal to be used only in the test mode is not provided in a semiconductor package.

SOLUTION: A test circuit includes: a plurality of comparators 6a-6c respectively supplying pulse signals including trigger signals and data signals by comparing voltages for a test mode having a pulse pattern including a plurality of voltage levels with a reference voltage; and a test signal generation circuit 5 generating test signals by performing a serial/parallel conversion on the data signals on the basis of the trigger signals to supply a circuit 9 to be tested with the test signals.

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