发明名称 METHOD OF FORMING RESISTANCE VARIABLE MEMORY DEVICE
摘要 A method of forming a resistance variable memory device, the method including forming a diode on a semiconductor substrate; forming a lower electrode on the diode; forming a first insulating film on the lower electrode, the first insulating film having an opening; forming a resistance variable film filling the opening such that the resistance variable film includes an amorphous region adjacent to a sidewall of the opening and a crystalline region adjacent to the lower electrode; and forming an upper electrode on the resistance variable film.
申请公布号 US2012142141(A1) 申请公布日期 2012.06.07
申请号 US201113241315 申请日期 2011.09.23
申请人 PARK JEONG-HEE;PARK JUNG-HWAN;HORII HIDEKI;CHO SUNG-LAE 发明人 PARK JEONG-HEE;PARK JUNG-HWAN;HORII HIDEKI;CHO SUNG-LAE
分类号 H01L21/06;H01L21/8246 主分类号 H01L21/06
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