发明名称 Programming Memory With Reduced Pass Voltage Disturb And Floating Gate-To-Control Gate Leakage
摘要 Program disturb is reduced in a non-volatile storage system by programming storage elements on a selected word line WLn in separate groups, according to the state of their WLn−1 neighbor storage element, and applying an optimal pass voltage to WLn−1 for each group. Initially, the states of the storage elements on WLn−1 are read. A program iteration includes multiple program pulses. A first program pulse is applied to WLn while a first pass voltage is applied to WLn−1, a first group of WLn storage elements is selected for programming, and a second group of WLn storage elements is inhibited. Next, a second program pulse is applied to WLn while a second pass voltage is applied to WLn−1, the second first group of WLn storage elements is selected for programming, and the first group of WLn storage elements is inhibited. A group can include one or more data states.
申请公布号 US2012140568(A1) 申请公布日期 2012.06.07
申请号 US201213370410 申请日期 2012.02.10
申请人 DUTTA DEEPANSHU;CHIN HENRY 发明人 DUTTA DEEPANSHU;CHIN HENRY
分类号 G11C16/04 主分类号 G11C16/04
代理机构 代理人
主权项
地址