发明名称 X-RAY INSPECTION DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide an X-ray inspection device capable of improving following performance in fluoroscopy and serial radiography by quickly changing X-ray tube output. <P>SOLUTION: When an absolute value of an amount of change per unit time from a filament current of current pulse output to a filament current of subsequent pulse output calculated by a filament current change amount calculation unit 61 is equal to or higher than a setting value, an X-ray inspection device executes flash control between pulses for temporarily increasing or decreasing a filament current between the pulse output so as to adjust the filament current to be a filament current at the time of the flash control between pulses calculated by a filament current calculation unit 62 on the basis of X-ray conditions for the current pulse output and X-ray conditions for the subsequent pulse output. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012109127(A) 申请公布日期 2012.06.07
申请号 JP20100257404 申请日期 2010.11.18
申请人 SHIMADZU CORP 发明人 YABUGAMI KATSUHIRO
分类号 H05G1/34 主分类号 H05G1/34
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