发明名称 RADIATION EXAMINATION SYSTEM
摘要 <P>PROBLEM TO BE SOLVED: To provide a radiation examination system capable of improving reproducibility of a tomographic image or a stereoscopic image for an analyte, while shortening an examination time. <P>SOLUTION: An image correction device 15: checks a radiation intensity distribution obtained from a radiation detector 2 when moving a radiation source 1 to any target position during a first scan, and a radiation intensity distribution obtained from the radiation detector 2 when moving the radiation source 1 to the same target position during a second scan; calculates a shift amount of a part in which the radiation intensity distributions should overlap; calculates an error of the focal position of the radiation source 1 based on the shift amount; and corrects a plurality of transmission images P based on the error. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012107877(A) 申请公布日期 2012.06.07
申请号 JP20100254766 申请日期 2010.11.15
申请人 HITACHI-GE NUCLEAR ENERGY LTD 发明人 NAGUMO YASUSHI;NUKAGA ATSUSHI;SADAOKA NORIYUKI
分类号 G01N23/04 主分类号 G01N23/04
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