| 摘要 |
<p>[Problem] To provide a total reflection spectroscopic measurement device capable of ensuring measurement accuracy while avoiding upsizing of the device. [Solution] In a total reflection spectroscopic measurement device (1), a reflection surface (31c), on which an object to be measured (34) is disposed, of an internal total reflection prism (31) is located at an obtuse angle to an incidence surface (31a) on which a terahertz wave generation element (32) is provided. Consequently, it becomes possible to cause a terahertz wave (T) generated by the terahertz wave generation element (32) to be incident in a state nearly perpendicular to a first optical surface (31d), thereby making it possible to minimize the size of the first optical surface (31d) with respect to the divergence angle of the terahertz wave (T). Consequently, the upsizing of the device can be avoided. Further, this means that the divergence angle of the terahertz wave (T) which can be supported by the first optical surface (31d) of the same size can be increased, and the accuracy of reflection spectroscopic measurement can be ensured by suppressing the loss of the terahertz wave (T).</p> |
