发明名称 PHANTOM FOR IRRADIATION ANGLE MEASUREMENT AND IRRADIATION ANGLE MEASUREMENT METHOD AND STEREOSCOPIC IMAGE ACQUISITION METHOD USING SAID PHANTOM
摘要 <p>[Problem] To acquire the actual imaging angles during stereoscopic imaging with high precision. [Solution] A phantom (6) for irradiation angle measurement is configured from a three-dimensional structure (60) obtained from a material having a first transmittance with respect to radiation irradiated from a prescribed direction and at least two markers (61, 62) obtained from a material having a second transmittance, which differs from the first transmittance, and provided at mutually differing positions in the direction orthogonal to the opposing surfaces (60a, 60b) of the three-dimensional structure (60). The irradiation angle is acquired using said irradiation angle measurement phantom (6).</p>
申请公布号 WO2012073433(A1) 申请公布日期 2012.06.07
申请号 WO2011JP06288 申请日期 2011.11.10
申请人 FUJIFILM CORPORATION;KUWABARA, TAKAO;OHTA, YASUNORI;KUSUNOKI, TETSUROU;YAHIRO, YASUKO;KAMIYA, TAKESHI 发明人 KUWABARA, TAKAO;OHTA, YASUNORI;KUSUNOKI, TETSUROU;YAHIRO, YASUKO;KAMIYA, TAKESHI
分类号 A61B6/00;A61B6/02 主分类号 A61B6/00
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