发明名称 ERROR CODE PATTERN GENERATION CIRCUIT AND SEMICONDUCTOR MEMORY DEVICE INCLUDING THE SAME
摘要 An error code pattern generation circuit includes a first storage unit configured to store at least one bit of an error code, and output error data for a first time period; and a second storage unit configured to store at least one remaining bit of the error code and output the error data for a second time period which is different from the first time period.
申请公布号 US2012144278(A1) 申请公布日期 2012.06.07
申请号 US20100980450 申请日期 2010.12.29
申请人 PARK JUNG-HOON 发明人 PARK JUNG-HOON
分类号 H03M13/09;G06F11/10 主分类号 H03M13/09
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