发明名称 |
SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME |
摘要 |
A semiconductor memory device includes a transistor having a channel region buried in a substrate and source/drain regions formed to provide low contact resistance. A field isolation structure is formed in the substrate to define active structures. The field isolation structure includes a gap-fill pattern, a first material layer surrounding the gap-fill pattern, and a second material layer surrounding at least a portion of the first material layer. Each active structure includes a first active pattern having a top surface located beneath the level of the top surface of the field isolation structure, and a second active pattern disposed on the first active pattern and whose top is located above the level of the top surface of the field isolation structure.
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申请公布号 |
US2012139021(A1) |
申请公布日期 |
2012.06.07 |
申请号 |
US201113241435 |
申请日期 |
2011.09.23 |
申请人 |
KIM SEOK-HYUN;HWANG DEOK-SUNG;LEE YUN-JAE;LEE CHUL;JANG YOON-TAEK;JEON CHANG-HOON;AHN SANG-BIN;AHN JUN-HYEOK;SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM SEOK-HYUN;HWANG DEOK-SUNG;LEE YUN-JAE;LEE CHUL;JANG YOON-TAEK;JEON CHANG-HOON;AHN SANG-BIN;AHN JUN-HYEOK |
分类号 |
H01L27/108 |
主分类号 |
H01L27/108 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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