发明名称 SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME
摘要 A semiconductor memory device includes a transistor having a channel region buried in a substrate and source/drain regions formed to provide low contact resistance. A field isolation structure is formed in the substrate to define active structures. The field isolation structure includes a gap-fill pattern, a first material layer surrounding the gap-fill pattern, and a second material layer surrounding at least a portion of the first material layer. Each active structure includes a first active pattern having a top surface located beneath the level of the top surface of the field isolation structure, and a second active pattern disposed on the first active pattern and whose top is located above the level of the top surface of the field isolation structure.
申请公布号 US2012139021(A1) 申请公布日期 2012.06.07
申请号 US201113241435 申请日期 2011.09.23
申请人 KIM SEOK-HYUN;HWANG DEOK-SUNG;LEE YUN-JAE;LEE CHUL;JANG YOON-TAEK;JEON CHANG-HOON;AHN SANG-BIN;AHN JUN-HYEOK;SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM SEOK-HYUN;HWANG DEOK-SUNG;LEE YUN-JAE;LEE CHUL;JANG YOON-TAEK;JEON CHANG-HOON;AHN SANG-BIN;AHN JUN-HYEOK
分类号 H01L27/108 主分类号 H01L27/108
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