| 摘要 |
A quantum-yield measurement device (1A) measures the quantum yield of a sample (S) by shining excitation light (L1) on a sample-containing part (3) of a sample cell (2) for containing a sample (S) and detecting light (L2) emitted from the sample (S) and/or the sample-containing part (3). Said quantum-yield measurement device (1A) is provided with: a light-tight box (5) inside which the aforementioned sample-containing part (3) is disposed; a light-generation unit (6) that has a light-emission part (7) connected to the light-tight box (5) and generates the abovementioned excitation light (L1); a light-detection unit (9) that has a light-receiving part (11) connected to the light-tight box (5) and detects the abovementioned light to be measured (L2); an integrating sphere (14) that is disposed inside the light-tight box (5) and has a light-input aperture (15) into which the excitation light (L1) is inputted and a light-output aperture (16) through which the light to be measured (L2) is outputted; and a movement mechanism (30) that moves the sample-containing part (3), the light-emission part (7), and the light-receiving part (11) between a first state in which the sample-containing part (3) is located inside the integrating sphere (14) and a second state in which the sample-containing part (3) is located outside the integrating sphere (14). In the first state, the movement mechanism makes the light-emission part (7) face the light-input aperture (15) and the light-receiving part (11) face the light-output aperture (16). |
