发明名称 MOLTEN GLASS EXAMINATION DEVICE
摘要 <p>The present invention relates to a molten glass examination device in which molten glass is caused to flow downward through a drain pipe and the molten glass is examined during this downward flow; the molten glass examination device comprises the following: an image pick-up means for intermittently picking up images of the downward flowing molten glass at specific image pick-up intervals; an image processing means for binarizing the images of the molten glass picked-up by the image pick-up means; a flaw detection and counting means for detecting and counting flaws inherent in the molten glass on the basis of the images that were binarized by the image processing means; and a flaw display means for displaying, in a time sequence, the flaw counting results counted by the flaw detection and counting means.</p>
申请公布号 WO2012073625(A1) 申请公布日期 2012.06.07
申请号 WO2011JP74878 申请日期 2011.10.27
申请人 ASAHI GLASS COMPANY, LIMITED;IKENOTA MINORU;KANEKO SHIZUNORI;UZAKI SHUSAKU 发明人 IKENOTA MINORU;KANEKO SHIZUNORI;UZAKI SHUSAKU
分类号 C03B5/16 主分类号 C03B5/16
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