发明名称 Test apparatus for 64B/66B encoding process
摘要 The present invention provides a test apparatus for a 64B/66B encoding process capable of precisely performing a test with a high reproducibility on a certain pattern of a 64B/66B encoder or decoder. A frame generator generates frame data in a layer higher than a physical coding sublayer of Ethernet (registered trademark) and inputs the frame data to a 64B/66B encoder such that the 64B/66B encoder performs a 64B/66B encoding process of the physical coding sublayer with respect to the frame data. A sequence pattern generator generates a certain 66B sequence pattern written in advance, and a controller writes a desired sequence pattern in the sequence pattern generator and, at the same time, controls a data selector to select one of data encoded by the 64B/66B encoder and a sequence pattern output from the sequence pattern generator and to provide the selected one to a test subject.
申请公布号 US8194723(B2) 申请公布日期 2012.06.05
申请号 US20100710684 申请日期 2010.02.23
申请人 ITO TOMOHIRO;AWANO TAKAYUKI;ANRITSU CORPORATION 发明人 ITO TOMOHIRO;AWANO TAKAYUKI
分类号 H04B3/46;G06F11/00 主分类号 H04B3/46
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