| 摘要 |
PURPOSE: A test circuit is provided to stop a refresh operation of a redundant cell if an address for a normal cell is inputted. CONSTITUTION: A test signal generating unit(1) generates an enabled test signal when an address for a redundant cell is inputted and a disabled test signal when an address for a normal cell is inputted. A redundant cell refresh unit(2) refreshes the redundant cell by receiving a test signal. A delay unit(11) delays an enabled reset signal with a preset period. A logic unit(12) generates a test signal by receiving an idle signal and an output signal of the delay unit. |
