发明名称 |
Fuse circuit of semiconductor device and method for monitoring fuse state thereof |
摘要 |
A fuse circuit of a semiconductor device includes a plurality of fuse set units configured to compare an input address with address information programmed according to a fuse cutting state and a test control unit configured to enable one or more fuse set units selected based on a number of times that a selection signal is enabled in a test mode. |
申请公布号 |
US8193851(B2) |
申请公布日期 |
2012.06.05 |
申请号 |
US20090494520 |
申请日期 |
2009.06.30 |
申请人 |
KIM SEUNG-LO;HYNIX SEMICONDUCTOR INC. |
发明人 |
KIM SEUNG-LO |
分类号 |
H01H37/76;H01H85/00 |
主分类号 |
H01H37/76 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|