发明名称 PROBE UNIT FOR TESTING CHIP ON GLASS PANEL
摘要 PURPOSE: A probe unit for inspecting COG(Chip On Glass) panels is provided to facilitate manufacture and have a simple structure because a blade and a guide film are not necessary. CONSTITUTION: A probe unit for inspecting COG panels comprises a body block(110), a driving sheet(140), and a probe sheet(130). The driving sheet forms a lead wire on a substrate having non-conductance and hardness and populates a driving chip in one side of the substrate. The probe sheet forms a connecting wire connected with the lead wire on an insulating film and becomes a contact part where a specific position of the connecting wire contacts with a target inspection body. The body block fixes the probe sheet.
申请公布号 KR20120057344(A) 申请公布日期 2012.06.05
申请号 KR20100119031 申请日期 2010.11.26
申请人 KODI-S CO., LTD. 发明人 LEE, KWANG WON;CHOI, SOON CHEOL;JEON, SANG MIN
分类号 G01R1/073;G02F1/13 主分类号 G01R1/073
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