| 摘要 |
<p>PURPOSE: A semiconductor device and a testing method thereof are provided to reduce a test time by simultaneously testing chips even though a data channel is shared. CONSTITUTION: A first chip compresses test data of the first chip in a first test mode and outputs the compressed test data to a first data channel. A second chip compresses test data of the second chip in the first test mode and outputs the compressed test data to a second data channel. A first data output unit(200) is connected to the first data channel. A second data output unit(300) is connected to the second data channel.</p> |
