PROBE UNIT FOR TESTING CHIP ON GLASS PANEL

摘要

PURPOSE: A probe unit for inspecting COG(Chip On Glass) panels is provided to elastically inspect a target inspection body of a COG type by directly contacting a connecting wire of a probe sheet to a pad electrode. CONSTITUTION: A probe unit for inspecting COG panels comprises a body block(110), a driving sheet(140), and a probe sheet(130). The driving sheet forms a lead wire on a conductive substrate having an insulating layer and populates a driving chip in one side of the substrate. The probe sheet forms a connecting wire connected with the lead wire having non-conductance and hardness and becomes a contact part where a specific position of the connecting wire contacts to a target inspection body. The body block fixes the probe sheet.