发明名称 SEMICONDUCTOR DEVICE
摘要 <p>PURPOSE: A semiconductor device with a barrier metal layer is provided to control a short circuit generated between a gate and a source by preventing aluminum sparks from being generated in a polysilicon gate electrode. CONSTITUTION: A main transistor cell includes a gate electrode(6) and an source electrode of polysilicon. An interlayer insulating film(7) is formed on the gate electrode. A source electrode(101) includes aluminum which is not only connected to the source electrode but also extended onto the interlayer insulating film. A gate pad(102) includes aluminum connected to the gate electrode. A barrier metal layer(9) is interposed not only between the source electrode and the interlayer insulating film but also between the gate pad and the gate electrode.</p>
申请公布号 KR20120056770(A) 申请公布日期 2012.06.04
申请号 KR20110118734 申请日期 2011.11.15
申请人 MITSUBISHI ELECTRIC CORPORATION 发明人 SUEKAWA EISUKE;ORITSUKI YASUNORI;TARUI YOICHIRO
分类号 H01L29/772;H01L21/335 主分类号 H01L29/772
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