发明名称 |
FLASH MEMORY OF USING FRINGING FIELD EFFECT AND ELECTROSTATIC SHIELDING |
摘要 |
<p>PURPOSE: A flash memory which utilizes fringing and electrostatic shielding effects is provided to minimize interference due to an adjacent gate stack by generating an electrostatic shielding phenomenon using a gate electrode which is made of a conductive material. CONSTITUTION: A tunneling insulating film(110) is formed on a substrate(100). A first gate stack(150) is formed on the tunneling insulating film. The first gate stack is comprised of a first charge trapping layer(121), a first blocking insulation film(131), and a first gate electrode(141). A second gate stack(160) is formed on the tunneling insulating film. The second gate stack is comprised of a second charge trapping layer(123), a second blocking insulation film(133), and a second gate electrode(143).</p> |
申请公布号 |
KR101152446(B1) |
申请公布日期 |
2012.06.01 |
申请号 |
KR20100125142 |
申请日期 |
2010.12.08 |
申请人 |
IUCF-HYU (INDUSTRY-UNIVERSITY COOPERATION FOUNDATION HANYANG UNIVERSITY) |
发明人 |
KIM, TAE WHAN;KIM SUNG HO;YOU, JOO HYUNG |
分类号 |
H01L27/115;H01L21/8247 |
主分类号 |
H01L27/115 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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