发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
摘要 PURPOSE: A semiconductor device and a manufacturing method thereof are provided to improve insulating properties of an inter-electrode insulating film installed between a floating gate electrode film and a control gate electrode film. CONSTITUTION: A plurality of device separation grooves(3) is formed on the surface of a silicon substrate(2). A device separation insulating film(4) is formed within the device separation groove. A gate insulating film(5) is formed on a plurality of active regions(Sa) of the silicon substrate partitioned by a device separation region(Sb). A floating gate electrode film(6) is formed on the gate insulating film. An inter-electrode insulating film(7) is formed on the upper front and side surfaces of the floating gate electrode film. The inter-electrode insulating film is comprised of a first silicon oxide film(8), a first silicon nitride film(9), and a second silicon oxide film(10).
申请公布号 KR20120056195(A) 申请公布日期 2012.06.01
申请号 KR20110092462 申请日期 2011.09.14
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 MATSUO KAZUHIRO;TANAKA MASAYUKI;IIKAWA HIROFUMI
分类号 H01L27/115;H01L21/8247 主分类号 H01L27/115
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