| 摘要 |
PURPOSE: A semiconductor test socket is provided to prevent separation of conductive powder from a conductive pattern portion while a conductive cover sheet maintains elastic. CONSTITUTION: A conductive metal portion(130) is formed on a surface of a reinforcing portion(120) by gold plating. Therefore, a base structure portion(110) becomes conductive. An empty space of a three-dimensional mesh structure is filled with an insulating elastic portion(140). The degree of elasticity of a bidirectional conductive sheet(100) is determined according to the degree of elasticity of the insulating elastic portion. |
