| 摘要 |
PURPOSE: A semiconductor test socket is provided to make intervals between conductive patterns fine, thereby preventing conductivity of the conductive pattern from disappearing. CONSTITUTION: A base structure portion has a three dimensional network structure. A conductive metallic portion(130) is coated on the three dimensional network structure. An insulating elastic portion(140) is made of electrically insulating materials. An empty space of the three dimensional network structure is filled with the insulating elastic portion. A conductive mesh layer(150) is formed on one or all of an upper surface and a lower surface of the base structure portion. The conductive mesh layer has a two dimensional mesh structure. |
