发明名称 APPARATUS TO ANALYZING GROUP CHARACTERISTIC OF ION BEAM
摘要 PURPOSE: A collective ion beam property analysis apparatus is provided to reduce space restrictions by reliably measuring the collective properties of an ion beam by using a single apparatus. CONSTITUTION: A collective unit(120) is installed within a main body. An ion beam is directed into the collective unit. The focusing unit collects ions or electrons generated by colliding the ion beam with residual gas which is kept in an internal space. A charge quantity/distribution measuring unit(150) is connected to the collective unit within the main body. The charge quantity/distribution measuring unit amplifies and measures charge quantities and the distribution of the ions or the electrons. An energy measuring unit(140) is installed within the main body.
申请公布号 KR101151057(B1) 申请公布日期 2012.06.01
申请号 KR20100138524 申请日期 2010.12.30
申请人 KOREA ATOMIC ENERGY RESEARCH INSTITUTE 发明人 HA, JANG HO;KIM, NAM YOUNG;KIM, HAN SOO
分类号 H01J37/244;H01J37/08 主分类号 H01J37/244
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