发明名称 SEMICONDUCTOR DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To reduce forward voltage drop of a Schottky barrier diode by providing a second barrier metal 7 separately so as to cause conductivity modulation by using a barrier metal of low barrier height, thereby reducing drift resistance. <P>SOLUTION: The Schottky barrier diode 1 is configured so that a first barrier metal 6 joining to an N<SP POS="POST">-</SP>epitaxial layer 3 uses a barrier metal of low barrier height, and a second barrier metal 7 of high barrier height is provided on the upper surface across the N<SP POS="POST">-</SP>epitaxial layer 3 and a P<SP POS="POST">+</SP>guard ring 4. Consequently, the micro-current region has a curve of low VF characteristics, and minority carriers are injected positively from the P<SP POS="POST">+</SP>guard ring 4 to the high current region so as to have low VF characteristics thus reducing forward voltage drop. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012104696(A) 申请公布日期 2012.05.31
申请号 JP20100252768 申请日期 2010.11.11
申请人 NIPPON INTER ELECTRONICS CORP 发明人 INADA MASAKI;ICHIKAWA MUNETO;EBINO TAIICHI
分类号 H01L29/872;H01L29/47 主分类号 H01L29/872
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