| 摘要 |
<P>PROBLEM TO BE SOLVED: To evaluate ferroelectricity without contacting an organic ferroelectric material. <P>SOLUTION: Usually, upon forming a flexible electronic device with an organic ferroelectric material, ferroelectricity is evaluated after a terminal is provided and the electronic device is formed. Intensity of sum frequency light generated by radiating laser beams with different wavelengths such as visible light and infrared light is detected to evaluate the ferroelectricity without destructing or contacting the organic ferroelectric material. This can substantially reduce expenses for forming the electronic device using the organic ferroelectric material especially with a large area on which a large number of elements are integrated. <P>COPYRIGHT: (C)2012,JPO&INPIT |
