发明名称 VERIFYING MULTI-CYCLE SELF REFRESH OPERATION OF SEMICONDUCTOR MEMORY DEVICE AND TESTING THE SAME
摘要 A semiconductor memory device includes a memory cell array, a tag information register, a refresh control circuit and a DQ pin. The memory cell array includes multiple memory cells divided into first cells and second cells according to corresponding data retention times. The tag information register stores refresh cycle information for each wordline connected to the first cells and the second cells. The refresh control circuit is configured to generate a refresh enable signal and a refresh address based on the refresh cycle information. The DQ pin is configured to output the refresh enable signal, the refresh address and data stored in the memory cell array.
申请公布号 US2012134224(A1) 申请公布日期 2012.05.31
申请号 US201113281823 申请日期 2011.10.26
申请人 SHIM BO-IL;PARK SANG-WON;SAMSUNG ELECTRONICS CO., LTD. 发明人 SHIM BO-IL;PARK SANG-WON
分类号 G11C11/402;G11C29/56 主分类号 G11C11/402
代理机构 代理人
主权项
地址