| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a device and a method suitable for a surface characteristic measurement of a high reflectivity surface. <P>SOLUTION: The device is provided with at least one radiation device (2) by which a measuring surface (10) is irradiated, and at least one first radiation detection device (4) for outputting at least one measurement signal among the radiation scattered by the measuring surface, and the device includes a second radiation device (12) and a second radiation detection device (14) for executing a glossiness measurement of the measuring surface (10). The second radiation device (12) radiates on the measuring surface (10) with a prescribed incident angle (a), and the second radiation detection device (14) receives at least a part of the radiation, which is irradiated by at least the second radiation device (2) and after that, reflected from the measuring surface (10). According to this invention, in the case of radiating on the measuring surface by the second radiation device (12), the incident angle (a) to be formed with respect to a direction (M) perpendicular to the measuring surface (10) is 50° or smaller. <P>COPYRIGHT: (C)2012,JPO&INPIT |
