| 摘要 |
<P>PROBLEM TO BE SOLVED: To reduce the number of parallel test buses extending parallel within a wiring area. <P>SOLUTION: A semiconductor storage device 1 includes first test circuits 41a-41d that operate in any of a first test mode of generating a first output signal by receiving in parallel a plurality of comparison result signals showing a comparison result of respective memory contents of a plurality of memory cells contained in a memory cell array and converting to serial signals and a second test mode of generating a second output signal by compressing a data amount of the plurality of comparison result signals, and the first test circuits 41a-41d output the first output signal and the second output signal to a common bus 52. <P>COPYRIGHT: (C)2012,JPO&INPIT |
