发明名称 Method of Manufacturing Semiconductor Device and Semiconductor Device
摘要 A method of manufacturing a semiconductor device, in which a second semiconductor layer of AlxGa1-x-yInyN (wherein x, y, and x+y satisfy x>0, y≧0, and x+y≦̸1, respectively) on a first semiconductor layer of GaN by hetero-epitaxial growth using a MOCVD method, the method including the steps of: (a) supplying N source gas and Ga source gas to form the first semiconductor layer; (b) supplying the N source gas without supplying the Ga source gas and Al source gas, after step (a); (c) supplying the N source gas and the Al source gas without supplying the Ga source gas, after step (b); and (d) supplying the N source gas, the Ga source gas and the Al source gas to form the second semiconductor layer, after step (c).
申请公布号 US2012132962(A1) 申请公布日期 2012.05.31
申请号 US201113308360 申请日期 2011.11.30
申请人 SATO KEN;SANKEN ELECTRIC CO., LTD 发明人 SATO KEN
分类号 H01L29/205;C30B25/02;C30B25/14 主分类号 H01L29/205
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