发明名称 PROGRAM TESTING DEVICE, PROGRAM TESTING METHOD AND PROGRAM TESTING PROGRAM
摘要 <P>PROBLEM TO BE SOLVED: To provide a program device, a program testing method and a program testing program capable of performing program testing with a programmable condition and prohibiting occurrence of a program error. <P>SOLUTION: A program testing device comprises: a program input part 76 dividing a test target program 92 inputted from an input part 4 into multiple modules for each prescribed function by receiving an input of a program code corresponding to a facility element from the outside based on facility elements hierarchically arranged according to a plant facility configuration; and a program retrieval part 77 retrieving a program which has a prescribed relation to a program corresponding to one facility element based on facility information 87. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012103791(A) 申请公布日期 2012.05.31
申请号 JP20100249880 申请日期 2010.11.08
申请人 MITSUBISHI ELECTRIC CORP 发明人 NAKAGAWA KOICHI
分类号 G06F11/28;G06F11/36 主分类号 G06F11/28
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