发明名称 SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 A highly reliable semiconductor device is manufactured by giving stable electric characteristics to a transistor in which an oxide semiconductor film is used for a channel. An oxide semiconductor film which can have a first crystal structure by heat treatment and an oxide semiconductor film which can have a second crystal structure by heat treatment are formed so as to be stacked, and then heat treatment is performed; accordingly, crystal growth occurs with the use of an oxide semiconductor film having the second crystal structure as a seed, so that an oxide semiconductor film having the first crystal structure is formed. An oxide semiconductor film formed in this manner is used for an active layer of the transistor.
申请公布号 US2012132903(A1) 申请公布日期 2012.05.31
申请号 US201113297474 申请日期 2011.11.16
申请人 YAMAZAKI SHUNPEI;TAKAHASHI MASAHIRO;MARUYAMA TETSUNORI;SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 YAMAZAKI SHUNPEI;TAKAHASHI MASAHIRO;MARUYAMA TETSUNORI
分类号 H01L29/786;H01L21/34 主分类号 H01L29/786
代理机构 代理人
主权项
地址