发明名称 RESIST COMPOSITION, METHOD OF FORMING RESIST PATTERN, POLYMERIC COMPOUND AND COMPOUND
摘要 There are provided a resist composition, a method of forming a resist pattern using the resist composition, a novel polymeric compound and a compound useful as a monomer for the polymeric compound, the resist composition including a base component (A) that exhibits changed solubility in a developing solution under action of acid and an acid generator component (B) that generates acid upon exposure, wherein the base component (A) contains a resin component (A0) including a structural unit (a0) represented by general formula (a0) shown below [wherein A represents a divalent linking group; and R1 represents a hydrogen atom or a hydrocarbon group of 1 to 6 carbon atoms which may have a substituent.]
申请公布号 US2012135347(A1) 申请公布日期 2012.05.31
申请号 US201113305545 申请日期 2011.11.28
申请人 UTSUMI YOSHIYUKI;SESHIMO TAKEHIRO;HIRANO TOMOYUKI;TAKAKI DAICHI;TSUCHIYA JUNICHI;TOKYO OHKA KOGYO CO., LTD. 发明人 UTSUMI YOSHIYUKI;SESHIMO TAKEHIRO;HIRANO TOMOYUKI;TAKAKI DAICHI;TSUCHIYA JUNICHI
分类号 G03F7/20;C07D307/00;C08F18/12;G03F7/004 主分类号 G03F7/20
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