发明名称 METHOD AND DEVICE FOR MICROSCOPIC IMAGING OF SAMPLE STRUCTURE
摘要 <P>PROBLEM TO BE SOLVED: To provide a method and device for microscopic imaging of a sample structure. <P>SOLUTION: A sample structure 34 includes markers which can be converted into a state of being imaged by a light microscope. In the case of the existence of a prescribed active state where distances between the markers are longer than a minimum distance preliminarily determined by resolution limit of light-microscopic imaging, the sample structure 34 is imaged on an array 40 of sensor elements which generate image signals respectively, and these image signals bring a unit frame of the sample structure 34 as a whole. The existence of the prescribed active state is checked by generation of at least two test unit frames with a space therebetween and detection of respective variations in the image signals between two test unit frames in at least a part of the sensor elements. The existence of the prescribed active state is determined when variations detected in all of the image signals exceed a prescribed amount. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012103691(A) 申请公布日期 2012.05.31
申请号 JP20110228719 申请日期 2011.10.18
申请人 LEICA MICROSYSTEMS CMS GMBH 发明人 JOONAS FELLING
分类号 G02B21/36;G01N21/64 主分类号 G02B21/36
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