发明名称 MEASURING SYSTEMS FOR MEASURING ABSORPTION OR SCATTERING AT DIFFERENT WAVELENGTHS
摘要 A measuring system for measuring absorption or scattering of a medium at a plurality of different wavelengths, whereby the measurements for the different wavelengths are performable as simultaneously and as accurately as possible. The measuring system comprises: a measuring chamber; a transmitting unit, which sends light of its respective wavelength into the measuring chamber; a control, which operates each light source with a different time modulation of transmission intensity for each wavelength; a detector for measuring a total radiation intensity. The total radiation intensity corresponds to a superpositioning of each intensity portion striking the detector for each wavelength; and a signal processing system, which determines for each of the wavelengths the associated intensity portion based on the total radiation intensity measured by detector and the modulations.
申请公布号 US2012133935(A1) 申请公布日期 2012.05.31
申请号 US201113302056 申请日期 2011.11.22
申请人 ENDRESS + HAUSER CONDUCTA GESELLSCHAFT FUR MESS- UND REGELTECHNIK MBH + CO. KG 发明人 BERNHARD RALF
分类号 G01N21/47;G01N21/59 主分类号 G01N21/47
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