发明名称 Resistive Switching Memory Device
摘要 A resistive switching memory device is provided with first to third electrodes. The first electrode forms a Schottky barrier which can develop a rectifying property and resistance change characteristics at an interface between the first electrode and an oxide semiconductor. The third electrode is made of a material which provides an ohmic contact with the oxide semiconductor. A control voltage is applied between the first and second electrodes, and a driving voltage is applied between the first and third electrodes.
申请公布号 US2012132883(A1) 申请公布日期 2012.05.31
申请号 US201113323927 申请日期 2011.12.13
申请人 HIROSE SAKYO;MURATA MANUFACTURING, CO., LTD. 发明人 HIROSE SAKYO
分类号 H01L45/00 主分类号 H01L45/00
代理机构 代理人
主权项
地址