发明名称 THIN PLATE INSPECTION DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a thin plate inspection device enabling a stable measurement regarding a detection of the presence or absence of a crack on a thin plate as a measured object, regardless of variations of the shape etc. of the measured object and an installation position of support means. <P>SOLUTION: A thin plate inspection device emits a sound wave from a vibration plate 12. A variation of sound pressure gives a buoyant force to a measured object 50, thereby vibrating the whole of the measured object 50 with a displacement magnitude &Delta;r2. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012103034(A) 申请公布日期 2012.05.31
申请号 JP20100249556 申请日期 2010.11.08
申请人 MITSUBISHI ELECTRIC CORP 发明人 KOMAE SOTA;FUJIWARA SUSUMU
分类号 G01N29/14 主分类号 G01N29/14
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