发明名称 PLASMA PROCESSING DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a plasma processing device capable of improving in-plane uniformity of plasma treatment by suppressing a temperature rise in the periphery of a substrate to be processed, thereby capable of uniform plasma treatment. <P>SOLUTION: The plasma processing device includes: a processing chamber capable of blocking the inside in an airtight manner; a processing gas supply mechanism for supplying processing gas to the internal chamber; an exhaust mechanism for exhausting gas from the internal chamber; a plasma generation mechanism for generating plasma of the processing gas; a mounting table disposed in the processing chamber and configured to mount the substrate to be processed on an identical plane to a focus ring disposed to surround the periphery of the substrate to be processed; a temperature regulation mechanism for regulating the temperature of the mounting table; and an electrostatic chuck disposed on the top face of the mounting table and having a suction electrode extending to the lower portion of the focus ring. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012104579(A) 申请公布日期 2012.05.31
申请号 JP20100250461 申请日期 2010.11.09
申请人 TOKYO ELECTRON LTD 发明人 NAGAYAMA MASAYUKI;KIKUCHI EIICHIRO
分类号 H01L21/3065;H01L21/683 主分类号 H01L21/3065
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